IEC (International Elastomer Conference)

Modern materials development is a complex process conducted at micro as well as macro level. Understanding the microstructure of materials can help design materials’ macrostructure properties. Microscopy can provide useful information in designing soft materials such as rubber compounds, starting with understanding the reinforcing fillers dispersion in the elastomer matrix. Advanced microscopy instrumentation can go far beyond the dispersion characterization. Scanning and transmission electron microscopy (SEM and (S)TEM) coupled with energy-dispersive x-ray spectroscopy (EDX) are useful instrumentation used in phase characterization of soft materials. Atomic force microscopy (AFM) coupled with Raman spectroscopy can provide an insight on sulfur crosslinking of rubber. Case studies of rubber and polymer blends showcase the experimental challenges for the microscopist and demonstrate that the usage of microscopy goes beyond phase characterization and filler dispersion and provides crucial mechanistic, structure and performance related information.

Our experts will be sharing more about this topic with a presentation called "Use of advanced microscopy to elucidate the structure and mechanism of crosslinking of rubber" at the conference.

Interested to learn more? Come meet us at the conference. More information can be found at International Elastomer Conference.