Do you need to identify and quantify elements like heavy metals? The ECCD offers you various possibilities from ppt level until % level.

Every chemical product consists of elements: the elements building the product, but also unwanted elements as a contamination in the product. Valuable information is retrieved by quantification of specific elements in your product. And which elements on what level are still present in for instance your waste streams?

Elemental analysis includes identification and quantification of elements in a sample, on % level for main elements and on ppm down to ppt level for trace elements. An unwanted color in your product? The presence of a specific element can be the cause! Optimizing the use of your metal catalyst? Follow the metal concentration in time!

ICP (Inductively Coupled Plasma) is a powerful technique in precise quantification of trace elements down to ppt level but also for elements present at % level. Up to 61 elements can be measured and quantified in one run with our systems. Depending on the required Limit of Detection (LOD) ICP-OES (optical Emission Spectrometry) or ICP-MS (Mass Spectrometry) or a combination of both systems is applied. For the necessary sample pretreatment we can use our microwave digestion systems but also fusion for difficult dissolvable elements like Silicon, Titanium, Palladium and other noble elements. We can also dissolve your product in organic solvent and measure in organic solvent with our ICP systems. Without any sample pretreatment we can provide a (semi) quantitative element scan by XRFS (X-Ray Fluorescence Spectrometry). The sample is unaffected and can be used afterwards for other purposes.

Depending on your question, the ECCD analytical tools, including the ones above, may find use as separate techniques or be combined in a multi-analytical approach.


Elemental analysis

  • ICP-OES 160 – 770 nm combined radial - axial detection equipment
  • ICP-OES low UV 130 – 770 nm (for ppb level detection of I, Br and Cl)
  • ICP-MS equipped with octopole reaction- and quadrupole detection system
  • ED XRFS system
  • WD XRFS system

Other techniques

  • GFAAS system equipped with camera
  • CVAFS for ppt level detection of Mercury
  • HAFS (Hydride Atomic Fluorescence Spectrometry) for ppt level detection of Bismuth, Selenium and Arsenic
  • CHNSO analyzer

Sample pretreatment

  • Microwave medium pressure digestion system
  • Microwave high pressure digestion system
  • Fusion system
  • Hot block system

Application areas

  • Research & Development:
  • Product optimization
  • Process optimization
  • Quality control
  • Inorganic impurity profiling
  • Failure analysis
  • Support for substance identification REACH
  • Product deformulation
  • Finding the root cause for coloration


The Expert Capability Center Deventer is located at the heart of the R&D center of Nouryon in Deventer, the Netherlands.

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